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| Feature | CITS25 | Si6000 | Si8000m | Comments | |
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Field solver type |
Method of Moments & Green's Function |
Boundary Element BEM |
Both are industry proven methods, providing consistent and comparable results |
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Number of trace configurations
|
12 | 39 | 100+ |
Additional configurations in Si8000 allow accurate modelling of structures with local variations in dielectric constants |
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Support multiple dielectric material layers
|
No | No | Yes |
Accurately model layers of different dielectric materials |
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Support for single Dk materials |
Yes | Yes | Yes |
Easy to use for simple constructions |
|
Support for resin-rich zones |
No | No | Yes | Accurately model glass-depleted zones between differential tracks due to resin squeeze-out | |
Support for variable coating thickness |
No | No | Yes | Account for different coating thickness over tracks, substrates and between differential pairs | |
Activation types |
Dongle
only (hardware key) |
Dongle,
node locked e-file, floating/server: (Plus annual and quarterly licenses) |
Flexible
licensing to suit your requirements. |
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Extended interface: "Quick Solver" |
No | No | Yes | See
the effect of process tolerance at a glance |
|
Compatible with Polar Speedstack stackup builder |
No | No | Yes | Incorporates
stackup and controlled impedance data in a single file |
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| Multi-language support | No | No | Yes | English, German, Japanese, Simplified Chinese, Traditional Chinese, Korean languages supported | |
| On-line help | No | No | Yes | Continually updated online help system | |
| Spreadsheet modelling and goal-seeking | No | Yes | Yes | Wide range of advanced functions, e.g. sensitivity analysis; graphical presentation of the effects of parameter value changes | |
| Support for coplanar structures | No | Yes | Yes |
Wide
range of Coplanar structures modelled; (with the advantage of
single-sided construction and showing only minor dispersion effects
coplanar configuration is ideally suited for surface mounted devices.) |
|
| Calculates for local variations in dielectric constant | No | No | Yes | Si8000 takes into account the local variations in dielectric constant on close spaced differential structures (e.g. areas of high resin concentration between differential pairs). | |
| Surface coating modelling | No | No | Yes | Si8000 models the solder resist thickness adjacent to, above and between surface traces | |
| Constant Pitch goal seeking | No | No | Yes | S1 parameter adjusted automatically as W1 / W2 trace widths changes to maintain trace separation. | |
| Sensitivity Analysis | No | No | Yes | Calculate
and plot impedance against a specified structure parameter Graph constant impedance vs changing X / Y axis parameters |
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| Odd, even impedance modelling | No | Yes | |||
| Dual coated structures | No | No | Yes | ||
Future development |
Development complete | Development complete | Yes | Interfaces with Speedstack layer stack up design system and planned future modules. | |